of_iiiv_cal_kit
III-V on-wafer calibration and de-embedding kit
Maturity plannedTargets III-V processDifficulty MediumPriority 1
On-wafer TRL, LRRM and SOLT calibration standards (thru, line set, open, short, load) plus pad and access-line de-embedding structures for GaAs and InP RF and photonic test chips.
Planned. This block is specified in the catalog with its interfaces and targets. No implementation exists yet; the skeleton command below generates a lint-clean shell with its ports and registers.
Interfaces
| Port | Direction | Kind | Width | Notes |
|---|---|---|---|---|
| rf_p1 | inout | RF | 1 | |
| rf_p2 | inout | RF | 1 |
Standards
No external standard applies.
More in iii_v
| ID | Block | Maturity |
|---|---|---|
| of_inp_mmi_lib | InP MMI and passive photonic component library | planned |
| of_inp_ssc_edge | InP spot-size converter and edge coupler | planned |
| of_iiiv_model_pack | III-V compact model pack | planned |
| of_iiiv_chiplet_bond | III-V on Si flip-chip pad and bump library | planned |
| of_iiiv_thermal_tuner | III-V photonic thermal tuner cell | planned |