IP PortfolioPhysical IP
Foundation physical IP
Standard cell libraries, I/O pads, memory compilers, eFuse/OTP/NVM, ESD, level shifters, power switches, tap/decap/filler, seal rings and test structures.
Blocks 96Implemented 0Families 13III-V process 22 · ASIC (CMOS) only 74
standard cell libraries 8special-purpose cells 14physical-only cells 5i/o pads 14esd protection 5memory compilers 10non-volatile memory 6test structures and process monitors 7die marking, alignment and finishing 5iii-v device libraries 7iii-v circuit cell libraries 3iii-v passives, interconnect and test 6iii_v 6
standard cell libraries
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_sc_hd | High-density standard cell library | planned | ASIC (CMOS) only | Hard |
| of_sc_hs | High-speed standard cell library | planned | ASIC (CMOS) only | Hard |
| of_sc_ll | Low-leakage standard cell library | planned | ASIC (CMOS) only | Hard |
| of_sc_mvt | Multi-Vt cell variants | planned | ASIC (CMOS) only | Hard |
| of_sc_ulv | Near-threshold standard cell library | planned | ASIC (CMOS) only | Very hard |
| of_sc_radhard | Radiation-hardened cell library | planned | ASIC (CMOS) only | Very hard |
| of_sc_cryo | Cryogenic standard cell library | planned | ASIC (CMOS) only | Very hard |
| of_sc_hightemp | High-temperature characterized library | planned | ASIC (CMOS) only | Hard |
special-purpose cells
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_sc_retention | State-retention flip-flops | planned | ASIC (CMOS) only | Hard |
| of_sc_level_shift | Level shifter cells | planned | ASIC (CMOS) only | Medium |
| of_sc_isolation | Isolation cells | planned | ASIC (CMOS) only | Medium |
| of_sc_aon | Always-on buffers and inverters | planned | ASIC (CMOS) only | Medium |
| of_sc_power_switch | Header and footer power switch cells | planned | ASIC (CMOS) only | Hard |
| of_sc_icg | Integrated clock gating cells | planned | ASIC (CMOS) only | Medium |
| of_sc_clock | Clock tree cells | planned | ASIC (CMOS) only | Medium |
| of_sc_sync | Synchronizer flip-flop cells | planned | ASIC (CMOS) only | Hard |
| of_sc_mbff | Multi-bit flip-flops | planned | ASIC (CMOS) only | Medium |
| of_sc_async | Asynchronous logic cells | planned | ASIC (CMOS) only | Hard |
| of_sc_dual_rail | Dual-rail precharge logic cells | planned | ASIC (CMOS) only | Very hard |
| of_sc_eco | ECO spare and gate-array cells | planned | ASIC (CMOS) only | Medium |
| of_sc_body_bias | Body-bias tap and generator cells | planned | ASIC (CMOS) only | Hard |
| of_sc_delay | Delay cells | planned | ASIC (CMOS) only | Easy |
physical-only cells
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_sc_tap | Well tap cells | planned | ASIC (CMOS) only | Easy |
| of_sc_decap | Decoupling capacitor cells | planned | ASIC (CMOS) only | Easy |
| of_sc_filler | Filler cells | planned | ASIC (CMOS) only | Easy |
| of_sc_endcap | Endcap and boundary cells | planned | ASIC (CMOS) only | Easy |
| of_sc_tie_antenna | Tie and antenna diode cells | planned | ASIC (CMOS) only | Easy |
i/o pads
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_io_gpio | General-purpose I/O cell | planned | ASIC (CMOS) only | Hard |
| of_io_failsafe | Fail-safe and 5 V tolerant I/O | planned | ASIC (CMOS) only | Hard |
| of_io_od | Open-drain I2C / I3C I/O | planned | ASIC (CMOS) only | Medium |
| of_io_lvds | LVDS I/O cells | planned | ASIC (CMOS) only | Hard |
| of_io_cml | CML / LVPECL clock I/O | planned | ASIC (CMOS) only | Hard |
| of_io_sstl | SSTL / POD memory I/O cells | planned | ASIC (CMOS) only | Very hard |
| of_io_analog | Analog pad | planned | ASIC (CMOS) only | Medium |
| of_io_rf | RF pad | planned | ASIC (CMOS) only | Hard |
| of_io_xtal | Crystal oscillator I/O cell | planned | ASIC (CMOS) only | Hard |
| of_io_power | Power and ground pads | planned | ASIC (CMOS) only | Medium |
| of_io_corner_filler | I/O corner and filler cells | planned | ASIC (CMOS) only | Easy |
| of_io_bondpad | Bond and bump pad library | planned | ASIC (CMOS) only | Medium |
| of_io_ring_gen | I/O ring generator | planned | ASIC (CMOS) only | Medium |
| of_hybrid_bond_pad | Hybrid bonding pad library | planned | ASIC (CMOS) only | Very hard |
esd protection
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_esd_rc_clamp | RC-triggered power clamp | planned | ASIC (CMOS) only | Hard |
| of_esd_diode | ESD diode library | planned | ASIC (CMOS) only | Medium |
| of_esd_snapback | GGNMOS and SCR clamps | planned | ASIC (CMOS) only | Hard |
| of_esd_rf | Low-capacitance RF ESD | planned | ASIC (CMOS) only | Hard |
| of_esd_cross_domain | Cross-domain ESD protection | planned | ASIC (CMOS) only | Medium |
memory compilers
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_mc_sram_sp | Single-port SRAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_sram_dp | True dual-port SRAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_sram_2p | Two-port (1R1W) SRAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_rf | Register-file compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_sram_lv | Low-voltage 8T SRAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_rom | ROM compiler | planned | ASIC (CMOS) only | Hard |
| of_mc_cam | CAM and TCAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_edram | Gain-cell embedded DRAM compiler | planned | ASIC (CMOS) only | Very hard |
| of_mc_cim | Compute-in-memory SRAM macro | planned | ASIC (CMOS) only | Very hard |
| of_mc_sram_rt | Radiation-tolerant SRAM compiler | planned | ASIC (CMOS) only | Very hard |
non-volatile memory
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_nvm_efuse | eFuse macro and controller | planned | ASIC (CMOS) only | Hard |
| of_nvm_antifuse | Antifuse OTP macro | planned | ASIC (CMOS) only | Very hard |
| of_nvm_mtp | Logic-process MTP NVM | planned | ASIC (CMOS) only | Very hard |
| of_nvm_flash_if | Embedded flash controller | planned | ASIC (CMOS) only | Hard |
| of_nvm_rram | RRAM macro | planned | ASIC (CMOS) only | Very hard |
| of_nvm_mram | Embedded MRAM macro | planned | ASIC (CMOS) only | Very hard |
test structures and process monitors
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_matching_arrays | Device matching test arrays | planned | ASIC (CMOS) only | Medium |
| of_pcm_si | Silicon process control monitor set | planned | ASIC (CMOS) only | Medium |
| of_ring_osc | Ring oscillator process monitor | planned | ASIC (CMOS) only | Medium |
| of_rel_struct | Reliability test structures | planned | ASIC (CMOS) only | Medium |
| of_sram_yield | SRAM yield and bitmap test vehicle | planned | ASIC (CMOS) only | Hard |
| of_thermal_test | Thermal test structures | planned | ASIC (CMOS) only | Easy |
| of_crack_detect | Die crack and moisture detector | planned | ASIC (CMOS) only | Easy |
die marking, alignment and finishing
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_seal_ring | Seal ring | planned | ASIC (CMOS) only | Easy |
| of_align_marks | Lithography alignment and overlay marks | planned | ASIC (CMOS) only | Easy |
| of_die_mark | Die marking and logo cells | planned | ASIC (CMOS) only | Easy |
| of_chip_id_rom | Metal-programmable chip ID cell | planned | ASIC (CMOS) only | Easy |
| of_fill_gen | Density fill generator | planned | ASIC (CMOS) only | Medium |
iii-v device libraries
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_gaas_phemt_lib | GaAs pHEMT device library | planned | III-V process | Very hard |
| of_gaas_hbt_lib | GaAs HBT device library | planned | III-V process | Very hard |
| of_inp_hbt_lib | InP DHBT device library | planned | III-V process | Very hard |
| of_inp_hemt_lib | InP HEMT device library | planned | III-V process | Very hard |
| of_inp_pic_lib | InP photonic building block library | planned | III-V process | Very hard |
| of_gaas_vcsel_lib | GaAs VCSEL and photodiode library | planned | III-V process | Very hard |
| of_iiiv_diode_lib | III-V Schottky and varactor diode library | planned | III-V process | Hard |
iii-v circuit cell libraries
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_gaas_dcfl_lib | GaAs E/D-mode logic cell library | planned | III-V process | Very hard |
| of_inp_cml_lib | InP HBT CML/ECL logic cell library | planned | III-V process | Very hard |
| of_iiiv_esd | III-V ESD protection cells | planned | III-V process | Hard |
iii-v passives, interconnect and test
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_iiiv_passives | III-V MMIC passive library | planned | III-V process | Hard |
| of_iiiv_tlines | Transmission line library | planned | III-V process | Medium |
| of_iiiv_tsv | Through-substrate via and backside cells | planned | III-V process | Medium |
| of_iiiv_rf_pads | III-V RF probe and bond pads | planned | III-V process | Easy |
| of_iiiv_pcm | III-V process control monitor set | planned | III-V process | Medium |
| of_iiiv_seal_ring | III-V seal ring and scribe set | planned | III-V process | Easy |
iii_v
| ID | Block | Maturity | Targets | Difficulty |
|---|---|---|---|---|
| of_inp_mmi_lib | InP MMI and passive photonic component library | planned | III-V process | Medium |
| of_inp_ssc_edge | InP spot-size converter and edge coupler | planned | III-V process | Medium |
| of_iiiv_cal_kit | III-V on-wafer calibration and de-embedding kit | planned | III-V process | Medium |
| of_iiiv_model_pack | III-V compact model pack | planned | III-V process | Hard |
| of_iiiv_chiplet_bond | III-V on Si flip-chip pad and bump library | planned | III-V process | Medium |
| of_iiiv_thermal_tuner | III-V photonic thermal tuner cell | planned | III-V process | Medium |