IP PortfolioPhysical IPtest structures and process monitors
of_pcm_si
Silicon process control monitor set
Maturity plannedTargets ASIC (CMOS) onlyDifficulty MediumPriority 1
Scribe-line PCM modules with transistor arrays, sheet and contact resistance (Kelvin, van der Pauw), capacitors, comb and serpentine yield structures on a standard probe pad pitch.
Planned. This block is specified in the catalog with its interfaces and targets. No implementation exists yet; the skeleton command below generates a lint-clean shell with its ports and registers.
Interfaces
| Port | Direction | Kind | Width | Notes |
|---|---|---|---|---|
| probe | inout | analog | 16 |
Standards
No external standard applies.
More in test structures and process monitors
| ID | Block | Maturity |
|---|---|---|
| of_matching_arrays | Device matching test arrays | planned |
| of_ring_osc | Ring oscillator process monitor | planned |
| of_rel_struct | Reliability test structures | planned |
| of_sram_yield | SRAM yield and bitmap test vehicle | planned |
| of_thermal_test | Thermal test structures | planned |
| of_crack_detect | Die crack and moisture detector | planned |